In order to fulfill high demands in the recent computer and communication technologies, highly-efficient devices and materials are being developed day by day. It is crucial to measure the electrical characteristics of these materials for new developments, especially the dielectric properties.
The dielectric measurement service offered by AET Associates, Inc., provides accurate results using the most suitable method according to size and shape of the sample material. Accuracy is achieved by combining a high Q cavity, a highly accurate measurement algorithm and 3D electromagnetic simulation software.
- Substrate materials for high-speed digital and microwave circuits
- Low loss dielectrics used for filters and dielectric antenna
- Thin film materials, Multilayered structure materials, New materials
- Semiconductor materials
- Medical Electronics
|Accurate measurement in the microwave range.
(Compliant standard: JIS C2565, ASTM D2520, IEC60556)
|The gap for inserting the measurement sample is fixed, and the measurement stability is superior to the pinching method.
(Compliant standard: JIS R1641, IPC-TM650 184.108.40.206, IEC62562)
|Non-destructive measurement of the permittivity of samples with a flat surface.
(PATENT No. 3691812)
|Open Coaxial Resonator
|Broad band and continued measurement frequency range; 10MHz～1GHz.
|The high-precision measurement is realized by the resonator of dedicated design.
The filling factor of powder is calculated from the true density information and the dielectric constant of the powder itself is calculated.
|Broad band and continued measurement frequency range; 200MHz～10GHz.
|Low-delay and low-loss wire materials, such as foamed PTFE, in product form can be measured with high accuracy.
|High dielectric material with low loss
|Measurement of low loss dielectric materials with tanδof 0.001 or less. (Compliant standard: JIS R1627, IEC 61338-1-3)
Highly Accurate Simulation by a 3D electromagnetic-field simulation software