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The Dielectric Measurement System (Microwave Dielectrometer) is developed based on AET\'s microwave and 3D EM simulation technologies. This system enables fast and non-destructive measurements of materials having various shapes, including thin films.

Microwave Dielectric Measurement System
(Microwave Dielectrometer)

The Microwave Dielectrometer developed by AET enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials using the evanescent mode of an open coaxial resonator. Additional expensive equipment such as network analyzers is not necessary. By using a built-in feedback oscillator circuit, accurate measurements can be done easily with a step-by-step operation. The accuracy of measurement is achieved by using a resonator, a highly accurate measurement algorithm and 3D electromagnetic simulation software.



20326 Via Volante, Cupertino, CA 95014, U.S.A.
TEL: +1-408-996-1760    FAX: +1-408-996-1962

Japan Headquarter

AET, Inc.
2-7-6 Kurigi, Asaoku, Kawasaki-city, Kanagawa, Japan
TEL: +81-44-980-0505    FAX: +81-44-980-1515