The Dielectric Measurement System (Microwave Dielectrometer) is developed based on AET\'s microwave and 3D EM simulation technologies. This system enables fast and non-destructive measurements of materials having various shapes, including thin films.
Microwave Dielectric Measurement System
The Microwave Dielectrometer developed by AET enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials using the evanescent mode of an open coaxial resonator. Additional expensive equipment such as network analyzers is not necessary. By using a built-in feedback oscillator circuit, accurate measurements can be done easily with a step-by-step operation. The accuracy of measurement is achieved by using a resonator, a highly accurate measurement algorithm and 3D electromagnetic simulation software.